Abstract
- Received 27 November 2012
DOI:https://doi.org/10.1103/PhysRevE.86.059906
©2012 American Physical Society
Publisher's Note: Impact of ultrafast electronic damage in single-particle x-ray imaging experiments [Phys. Rev. E 86, 051911 (2012)]
U. Lorenz, N. M. Kabachnik, E. Weckert, and I. A. Vartanyants
Phys. Rev. E 86, 059906 – Published 30 November 2012
