• Open Access

Probing μeγγ contact interactions with μe conversion

S. Davidson, Y. Kuno, Y. Uesaka, and M. Yamanaka
Phys. Rev. D 102, 115043 – Published 31 December 2020

Abstract

Contact interactions of a muon, an electron and two photons can contribute to the decay μeγγ, but also to the conversion of a muon into an electron in the electric field of a nucleus. We calculate the μe conversion rate, and show that for the coefficients of operators involving the combination FF|E|2 (as opposed to FF˜E·B), the current bound on μe conversion is more sensitive than the bound on μeγγ.

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  • Received 12 October 2020
  • Accepted 7 December 2020
  • Corrected 21 October 2021

DOI:https://doi.org/10.1103/PhysRevD.102.115043

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI. Funded by SCOAP3.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Particles & Fields

Corrections

21 October 2021

Correction: Table I contained a formatting error that was introduced at proof stage and has now been rectified.

Authors & Affiliations

S. Davidson1,*, Y. Kuno2,3,†, Y. Uesaka4,‡, and M. Yamanaka5,6,§

  • 1LUPM, CNRS, Université Montpellier, Place Eugene Bataillon, F-34095 Montpellier, Cedex 5, France
  • 2Department for Physics, Osaka University, Osaka 560-0043, Japan
  • 3Research Center of Nuclear Physics, Osaka University, Osaka 567-0047, Japan
  • 4Faculty of Science and Engineering, Kyushu Sangyo University, 2-3-1 Matsukadai, Higashi-ku, Fukuoka 813-8503, Japan
  • 5Department of Mathematics and Physics, Osaka City University, Osaka 558-8585, Japan
  • 6Nambu Yoichiro Institute of Theoretical and Experimental Physics (NITEP), Osaka City University, Osaka 558-8585, Japan

  • *s.davidson@lupm.in2p3.fr
  • kuno@phys.sci.osaka-u.ac.jp
  • uesaka@ip.kyusan-u.ac.jp
  • §yamanaka@osaka-cu.ac.jp

Article Text

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Issue

Vol. 102, Iss. 11 — 1 December 2020

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