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Microscopic reversal magnetization mechanisms in CoCrPt thin films with perpendicular magnetic anisotropy: Fractal structure versus labyrinth stripe domains

D. Navas, N. Soriano, F. Béron, C. T. Sousa, K. R. Pirota, J. Torrejon, C. Redondo, R. Morales, and C. A. Ross
Phys. Rev. B 96, 180403(R) – Published 7 November 2017

Abstract

The magnetization reversal of CoCrPt thin films has been examined as a function of thickness using magneto-optical Kerr effect (MOKE) microscopy and first-order reversal curves (FORC) techniques. MOKE images show differentiated magnetization reversal regimes for different film thicknesses: while the magnetic domains in 10-nm-thick CoCrPt film resemble a fractal structure, a labyrinth stripe domain configuration is observed for 20-nm-thick films. Although FORC distributions for both cases show two main features related to irreversible processes (propagation and annihilation fields) separated by a mostly flat region, this method can nonetheless distinguish which magnetization reversal process is active according to the horizontal profile of the first FORC peak, or propagation field. A single-peak FORC profile corresponds to the fractal magnetization reversal, whereas a flat-peak FORC profile corresponds to the labyrinth magnetization reversal.

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  • Received 27 June 2017
  • Revised 18 September 2017

DOI:https://doi.org/10.1103/PhysRevB.96.180403

©2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

D. Navas1,*, N. Soriano2, F. Béron3, C. T. Sousa1, K. R. Pirota3, J. Torrejon3, C. Redondo2, R. Morales4,5, and C. A. Ross6

  • 1IFIMUP-IN and Departamento de Física e Astronomia, Universidade do Porto, 4169-007 Porto, Portugal
  • 2Department of Chemical-Physics, University of the Basque Country UPV/EHU, 48940 Leioa, Spain
  • 3Universidade Estadual de Campinas, Instituto de Fisica Gleb Wataghin, BR-13083970 Campinas, SP, Brazil
  • 4Department of Chemical-Physics and BCMaterials, University of the Basque Country UPV/EHU, 48940 Leioa, Spain
  • 5IKERBASQUE, Basque Foundation for Science, 48011 Bilbao, Spain
  • 6Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachussets 02139, USA

  • *Corresponding author: davidnavasotero@gmail.com

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Issue

Vol. 96, Iss. 18 — 1 November 2017

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