Abstract
We report a systematic angle-resolved photoemission spectroscopy on topological insulator (TI) which is bulk insulating at and undergoes a metal-insulator-metal transition with the Sb content . We found that this transition is characterized by a systematic hole doping with increasing , which results in the Fermi-level crossings of the bulk conduction and valence bands at and , respectively. The Dirac point of the topological surface state is gradually isolated from the valence-band edge, accompanied by a sign reversal of Dirac carriers. We also found that the Dirac velocity is the largest among known solid-solution TI systems. The system thus provides an excellent platform for Dirac-cone engineering and device applications of TIs.
- Received 19 February 2016
DOI:https://doi.org/10.1103/PhysRevB.93.165123
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