Band structure engineering of topological insulator heterojunctions

Kyung-Hwan Jin, Han Woong Yeom, and Seung-Hoon Jhi
Phys. Rev. B 93, 075308 – Published 19 February 2016

Abstract

We investigate the topological surface states in heterostructures formed from a three-dimensional topological insulator (TI) and a two-dimensional insulating thin film, using first-principles calculations and the tight-binding method. Utilizing a single Bi or Sb bilayer on top of the topological insulators Bi2Se3, Bi2Te3, Bi2Te2Se, and Sb2Te3, we find that the surface states evolve in very peculiar but predictable ways. We show that strong hybridization between the bilayer and TI substrates causes the topological surface states to migrate to the top bilayer. It is found that the difference in the work function of constituent layers, which determines the band alignment and the strength of hybridization, governs the character of newly emerged Dirac states.

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  • Received 20 November 2015
  • Revised 27 January 2016

DOI:https://doi.org/10.1103/PhysRevB.93.075308

©2016 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Kyung-Hwan Jin1,2, Han Woong Yeom1,3, and Seung-Hoon Jhi1,*

  • 1Department of Physics, Pohang University of Science and Technology, Pohang 790-784, Republic of Korea
  • 2Department of Materials Science and Engineering, University of Utah, Salt Lake City, Utah 84112, USA
  • 3Center for Low Dimensional Electronic Symmetry, Pohang University of Science and Technology, Pohang 790-784, Republic of Korea

  • *Corresponding author: jhish@postech.ac.kr

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Issue

Vol. 93, Iss. 7 — 15 February 2016

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