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Photoinduced sign inversion of the anomalous Hall effect in EuO thin films

Y. Ohuchi, Y. Kozuka, N. Rezaei, M. S. Bahramy, R. Arita, K. Ueno, A. Tsukazaki, and M. Kawasaki
Phys. Rev. B 89, 121114(R) – Published 26 March 2014

Abstract

We report on the sign inversion of the anomalous Hall effect (AHE) in EuO thin films along with photoirradiation as well as a temperature scan across ∼25 K that is well below the Curie temperature (TC80 K). The former gives an enhancement of the mobile electron density (n) by more than 30%, but the latter gives a negligible modification of n of only 3% with a significant enhancement in mobility. It is found, in addition to the universal scaling law between longitudinal conductivity (σxx) and anomalous Hall conductivity (σAH) as |σAH|σxx1.6, that there is a critical value of about 102 S cm1 in σxx that gives a boundary in the sign inversion of σAH. If n solely governs the sign of σAH, the phenomenon could be explained by a Fermi level shift across the singularity in the band structure. However, our band calculation shows that, within any realistic adjustment of band parameters, the sign inversion of AHE never occurs. Thus, we conclude that other mechanisms of AHE are necessary to account for the AHE of EuO.

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  • Received 27 October 2013
  • Revised 26 February 2014

DOI:https://doi.org/10.1103/PhysRevB.89.121114

©2014 American Physical Society

Authors & Affiliations

Y. Ohuchi1, Y. Kozuka1,*, N. Rezaei2, M. S. Bahramy1,3, R. Arita1,4, K. Ueno4,5, A. Tsukazaki4,6, and M. Kawasaki1,3

  • 1Department of Applied Physics and Quantum-Phase Electronics Center (QPEC), University of Tokyo, Tokyo 113-8656, Japan
  • 2Department of Physics, Isfahan University of Technology, Isfahan 84154, Iran
  • 3Center for Emergent Matter Science (CEMS), RIKEN, Wako, Saitama 351-0198, Japan
  • 4PRESTO, Japan Science and Technology Agency (JST), Chiyoda-ku, Tokyo 102-0075, Japan
  • 5Department of Basic Science, University of Tokyo, Tokyo 153-8902, Japan
  • 6Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan

  • *Author to whom correspondence should be addressed: kozuka@ap.t.u-tokyo.ac.jp

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Issue

Vol. 89, Iss. 12 — 15 March 2014

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