Comparison of measured and simulated x-ray diffraction profiles showing (a) (I) the data collected on a laboratory diffractometer using a source (same as in Fig. 1 of our paper), (II) high-resolution synchrotron diffraction pattern of the same sample, collected on beamline ID31, European Synchrotron Radiation Facility (ESRF), Grenoble (), (III) a simulated pattern calculated for hcp lanthanum [space group and (Ref. 2)] with a March-preferred orientation and anisotropic peak broadening applied in the (0 0 4) direction (March coefficient 0.9), and (IV) a simulated pattern calculated for phenanthrene (, and ) with a March-preferred orientation in the (2 0 0) and (0 0 1) directions (March coefficients 0.35 and 0.58, respectively). (b) Zoom of the highest intensity peaks showing the clear similarities between the high-resolution pattern and that of hcp lanthanum.Reuse & Permissions
Figure 2
Temperature dependence of (a) the specific heat and (b) the electronic specific heat , where is the upper critical field for the present sample and for hcp lanthanum.[3] Here, for the present sample, the atomic weight of elemental La is used rather than the molecular weight of Ba-doped phenanthrene.Reuse & Permissions