Erratum: Quantitative analysis of nanoripple and nanoparticle patterns by grazing incidence small-angle x-ray scattering 3D mapping [Phys. Rev. B 85, 235415 (2012)]

Figure 1

(a) Representation of the shape used to model the form factor of the ripples. The direction of the ${\mathrm{Xe}}^{+}$ ion beam is also indicated. (b) Proposed sketch of the ${\mathrm{Al}}_2{\mathrm{O}}_3/\mathrm{Ag}/{\mathrm{Al}}_2{\mathrm{O}}_3$ trilayers. The surface of the rippled buffer layer is selectively decorated by the nanoparticles on the facets that face the incoming metallic flux indicated by the gray arrow, whereas, the surface roughness of the capping layer replicates the buried ripple pattern with an out-of-phase modulation.

Figure 2

Two-dimensional experimental GISAXS patterns of ${\mathrm{Al}}_2{\mathrm{O}}_3$-capped Ag nanoparticles grown on rippled ${\mathrm{Al}}_2{\mathrm{O}}_3$ thin films with Ag amounts of (a) 1.4 nm and (b) 2.8 nm. Corresponding 2D simulated GISAXS patterns using the configuration sketched in Fig. 1b are shown in (c) and (d), respectively.