Thermoelectric transport properties of CaMg2Bi2, EuMg2Bi2, and YbMg2Bi2

Andrew F. May, Michael A. McGuire, David J. Singh, Jie Ma, Olivier Delaire, Ashfia Huq, Wei Cai, and Hsin Wang
Phys. Rev. B 85, 035202 – Published 11 January 2012

Abstract

The thermoelectric transport properties of CaMg2Bi2, EuMg2Bi2, and YbMg2Bi2 were characterized between 2 and 650 K. As synthesized, the polycrystalline samples are found to have lower p-type carrier concentrations than single-crystalline samples of the same empirical formula. These low carrier concentration samples possess the highest mobilities yet reported for materials with the CaAl2Si2 structure type, with a mobility of 740 cm2/V/s observed in EuMg2Bi2 at 50 K. Despite decreases in the Seebeck coefficient (α) and electrical resistivity (ρ) with increasing temperature, the power factor (α2ρ) increases for all temperatures examined. This behavior suggests a strong asymmetry in the conduction of electrons and holes. The highest figure of merit (zT) is observed in YbMg2Bi2, with zT approaching 0.4 at 600 K for two samples with carrier densities of approximately 2×1018 cm3 and 8×1018 cm3 at room temperature. Refinements of neutron powder diffraction data yield similar behavior for the structures of CaMg2Bi2 and YbMg2Bi2, with smooth lattice expansion and relative expansion in c being 35% larger than relative expansion in a at 973 K. First-principles calculations reveal an increasing band gap as Bi is replaced by Sb and then As, and subsequent Boltzmann transport calculations predict an increase in α for a given n associated with an increased effective mass as the gap opens. The magnitude and temperature dependence of α suggests higher zT is likely to be achieved at larger carrier concentrations, roughly an order of magnitude higher than those in the current polycrystalline samples, which is also expected from the detailed calculations.

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  • Received 4 November 2011

DOI:https://doi.org/10.1103/PhysRevB.85.035202

©2012 American Physical Society

Authors & Affiliations

Andrew F. May*, Michael A. McGuire, and David J. Singh

  • Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

Jie Ma, Olivier Delaire, and Ashfia Huq

  • Quantum Condensed Matter Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

Wei Cai and Hsin Wang

  • High Temperature Materials Laboratory, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

  • *mayaf@ornl.gov

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Issue

Vol. 85, Iss. 3 — 15 January 2012

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