Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2 semiconductors (M = Mo, W; X = S, Se, Te)

Won Seok Yun, S. W. Han, Soon Cheol Hong, In Gee Kim, and J. D. Lee
Phys. Rev. B 85, 033305 – Published 17 January 2012

Abstract

Using the first-principles calculations, we explore the electronic structures of 2H-MX2 (M = Mo, W; X = S, Se, Te). When the number of layers reduces to a single layer, the indirect gap of bulk becomes a direct gap with larger gap and the band curvatures are found to lead to the drastic changes of effective masses. On the other hand, when the strain is applied on the single layer, the direct gap becomes an indirect gap and the effective masses vary. Especially, the tensile strain reduces the gap energy and effective masses while the compressive strain enhances them. Furthermore, the much larger tensile stress leads to become metallic.

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  • Received 21 November 2011

DOI:https://doi.org/10.1103/PhysRevB.85.033305

©2012 American Physical Society

Authors & Affiliations

Won Seok Yun1,2, S. W. Han1,*, Soon Cheol Hong1,†, In Gee Kim2, and J. D. Lee3

  • 1Department of Physics and Energy Harvest-Storage Research Center, University of Ulsan, Ulsan 680-749, Republic of Korea
  • 2Graduate Institute of Ferrous Technology, Pohang University of Science and Technology, Pohang 790-784, Republic of Korea
  • 3School of Materials Science & Research Center for Integrated Science, Japan Advanced Institute of Science and Technology, Ishikawa 923-1292, Japan

  • *Corresponding author: swhan72@ulsan.ac.kr
  • Corresponding author: schong@ulsan.ac.kr

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Vol. 85, Iss. 3 — 15 January 2012

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