Scattered surface charge density: A tool for surface characterization

Borislav Naydenov, Mauro Mantega, Ivan Rungger, Stefano Sanvito, and John J. Boland
Phys. Rev. B 84, 195321 – Published 28 November 2011
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Abstract

We demonstrate the use of nonlocal scanning tunneling spectroscopic measurements to characterize the local structure of adspecies in their states where they are significantly less perturbed by the probe, which is accomplished by mapping the amplitude and phase of the scattered surface charge density. As an example, we study single-H-atom adsorption on the n-type Si(100)-(4 × 2) surface, and demonstrate the existence of two different configurations that are distinguishable using the nonlocal approach and successfully corroborated by density functional theory.

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  • Received 27 April 2011

DOI:https://doi.org/10.1103/PhysRevB.84.195321

©2011 American Physical Society

Authors & Affiliations

Borislav Naydenov1,3, Mauro Mantega2,3, Ivan Rungger2,3, Stefano Sanvito2,3, and John J. Boland1,3,*

  • 1School of Chemistry, Trinity College, Dublin 2, Ireland
  • 2School of Physics, Trinity College, Dublin 2, Ireland
  • 3Center for Research on Adaptive Nanostructures and Nanodevices (CRANN), Trinity College, Dublin 2, Ireland

  • *jboland@tcd.ie

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Issue

Vol. 84, Iss. 19 — 15 November 2011

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