Avoiding power broadening in optically detected magnetic resonance of single NV defects for enhanced dc magnetic field sensitivity

A. Dréau, M. Lesik, L. Rondin, P. Spinicelli, O. Arcizet, J.-F. Roch, and V. Jacques
Phys. Rev. B 84, 195204 – Published 23 November 2011

Abstract

We report a systematic study of the magnetic field sensitivity of a magnetic sensor consisting of a single nitrogen-vacancy (NV) defect in diamond, by using continuous optically detected electron spin resonance (ESR) spectroscopy. We first investigate the behavior of the ESR contrast and linewidth as a function of the microwave and optical pumping power. The experimental results are in good agreement with a simplified model of the NV defect spin dynamics, leading to an optimized sensitivity around 2μT/Hz for a single NV defect in a high-purity diamond crystal grown by chemical vapor deposition. We then demonstrate an enhancement of the magnetic sensitivity by one order of magnitude by using a simple pulsed-ESR scheme. This technique is based on repetitive excitation of the NV defect with a resonant microwave π pulse followed by an optimized readout laser pulse, allowing to fully eliminate power broadening of the ESR linewidth. The achieved sensitivity is similar to that obtained by using Ramsey-type sequences, which is the optimal magnetic field sensitivity for the detection of a dc magnetic field.

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  • Received 7 September 2011

DOI:https://doi.org/10.1103/PhysRevB.84.195204

©2011 American Physical Society

Authors & Affiliations

A. Dréau1, M. Lesik1, L. Rondin1, P. Spinicelli1, O. Arcizet2, J.-F. Roch1, and V. Jacques1,*

  • 1Laboratoire de Photonique Quantique et Moléculaire, Ecole Normale Supérieure de Cachan and CNRS, UMR 8537, F-94235 Cachan, France
  • 2Institut Néel, Université Joseph Fourier and CNRS, UPR 2940, F-38042 Grenoble, France

  • *vjacques@lpqm.ens-cachan.fr

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Vol. 84, Iss. 19 — 15 November 2011

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