Abstract
The structure and interface characteristics of ()() superlattices deposited on a (100)-SrTiO substrate were studied using transmission electron microscopy (TEM). Cross-section TEM studies revealed that both (LVO) and (SVO) layers are good single-crystal quality and epitaxially grown with respect to the substrate. It is evidenced that LVO layers are made of two orientational variants of a distorted perovskite compatible with bulk , while SVO layers suffers from a tetragonal distortion due to the substrate-induced stain. Electron energy loss spectroscopy investigations indicate changes in the fine structure of the V edge, related to a valence change between the and the layers.
- Received 4 November 2010
DOI:https://doi.org/10.1103/PhysRevB.83.125403
©2011 American Physical Society