Abstract
We have investigated the active-layer-thickness dependence of exciton-photon interactions in planar CuCl microcavities with HfOSiO distributed Bragg reflectors. The active layer thickness was changed from 32 to 4, while the cavity length was fixed at 2. We performed angle-resolved reflectance measurements and clearly detected three cavity-polariton modes, originating from the lower, middle, and upper polariton branches, in a strong-coupling regime of the and excitons and cavity photon. The incidence-angle dependence of the cavity-polariton modes was analyzed using a phenomenological Hamiltonian for the strong coupling. It was found that the interaction energies of the cavity-polariton modes, the so-called vacuum Rabi splitting energies, are systematically controlled from 22(37) to 71(124) meV for the () exciton by changing the active layer thickness from 32 to 4. The active-layer-thickness dependence of the Rabi splitting energy is quantitatively explained by a simple theory for quantum-well microcavities.
- Received 18 October 2010
DOI:https://doi.org/10.1103/PhysRevB.83.075318
©2011 American Physical Society