Origin of insulating behavior of the p-type LaAlO3/SrTiO3 interface: Polarization-induced asymmetric distribution of oxygen vacancies

Lixin Zhang, Xiang-Feng Zhou, Hui-Tian Wang, Jing-Jun Xu, Jingbo Li, E. G. Wang, and Su-Huai Wei
Phys. Rev. B 82, 125412 – Published 9 September 2010

Abstract

It is revealed from first-principles calculations that polarization-induced asymmetric distribution of oxygen vacancies plays an important role in the insulating behavior at p-type LaAlO3/SrTiO3 interface. The formation energy of the oxygen vacancy (VO) is much smaller than that at the surface of the LaAlO3 overlayer, causing all the carriers to be compensated by the spontaneously formed VO’s at the interface. In contrast, at an n-type interface, the formation energy of VO is much higher than that at the surface, and the VO’s formed at the surface enhance the carrier density at the interface. This explains the puzzling behavior of why the p-type interface is always insulating but the n-type interface can be conducting.

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  • Received 29 April 2010

DOI:https://doi.org/10.1103/PhysRevB.82.125412

©2010 American Physical Society

Authors & Affiliations

Lixin Zhang1,2, Xiang-Feng Zhou1, Hui-Tian Wang1, Jing-Jun Xu1, Jingbo Li3, E. G. Wang4, and Su-Huai Wei2

  • 1School of Physics, Nankai University, Tianjin 300071, People’s Republic of China
  • 2National Renewable Energy Laboratory, Golden, Colorado 80401, USA
  • 3Institute of Semiconductor, Chinese Academy of Sciences, Beijing 100083, People’s Republic of China
  • 4School of Physics, Peking University, Beijing 100871, People’s Republic of China

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Issue

Vol. 82, Iss. 12 — 15 September 2010

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