Abstract
The epitaxial growth by reactive deposition of and nanodots on Si(111) is studied as a function of Fe coverage. The nanodots density, size, and strain were analyzed by atomic force microscopy and x-ray diffraction. Almost single phase and were formed at low and high iron coverage, respectively. A to change in phase formation is observed at Fe coverage of 5.5 nm, which is coincident with the coalescence of the nanodots, the relaxation of the strain in both phases and a discontinuous increase of the grain size of the phase. A direct comparison of the diffraction and microscopy data shows that nanodots of different phases also exhibit different shapes, being the nanodots smaller (larger) and with a low (high) aspect ratio.
- Received 16 December 2009
DOI:https://doi.org/10.1103/PhysRevB.81.113403
©2010 American Physical Society