Abstract
We present a method to prepare monolayer and multilayer suspended sheets of hexagonal boron nitride (h-BN), using a combination of mechanical exfoliation and reactive ion etching. Ultrahigh-resolution transmission electron microscope imaging is employed to resolve the atoms, and intensity profiles for reconstructed phase images are used to identify the chemical nature (boron or nitrogen) of every atom throughout the sample. Reconstructed phase images are distinctly different for h-BN multilayers of even or odd number. Unusual triangular defects and zigzag and armchair edge reconstructions are uniquely identified and characterized.
- Received 19 June 2009
DOI:https://doi.org/10.1103/PhysRevB.80.155425
©2009 American Physical Society
Viewpoint
Reaching a new resolution standard with electron microscopy
Published 12 October 2009
A new approach to reduce spherical and chromatic aberration in electron microscopy allows for low-energy imaging of single-layer boron nitride, a novel 2D nanostructure that is analogous to graphene.
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