Noise-induced spectral shift measured in a double quantum dot

B. Küng, S. Gustavsson, T. Choi, I. Shorubalko, T. Ihn, S. Schön, F. Hassler, G. Blatter, and K. Ensslin
Phys. Rev. B 80, 115315 – Published 15 September 2009

Abstract

We measure the shot noise of a quantum point-contact using a capacitively coupled InAs double quantum dot as an on-chip sensor. Our measurement signals are the (bidirectional) interdot electronic tunneling rates which are determined by means of time-resolved charge sensing. The detector frequency is set by the relative detuning of the energy levels in the two dots. For nonzero detuning, the noise in the quantum point contact generates inelastic tunneling in the double dot and thus causes an increase in the interdot tunneling rate. Conservation of spectral weight in the dots implies that this increase must be compensated by a decrease in the rate close to zero detuning, which is quantitatively confirmed in our experiment.

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  • Received 23 April 2009

DOI:https://doi.org/10.1103/PhysRevB.80.115315

©2009 American Physical Society

Authors & Affiliations

B. Küng1,*, S. Gustavsson1, T. Choi1, I. Shorubalko1,2, T. Ihn1, S. Schön3, F. Hassler4, G. Blatter4, and K. Ensslin1

  • 1Solid State Physics Laboratory, ETH Zurich, 8093 Zurich, Switzerland
  • 2Electronics/Metrology/Reliability Laboratory, EMPA, 8600 Dübendorf, Switzerland
  • 3FIRST Laboratory, ETH Zurich, 8093 Zurich, Switzerland
  • 4Theoretische Physik, ETH Zurich, 8093 Zurich, Switzerland

  • *kuengb@phys.ethz.ch

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Vol. 80, Iss. 11 — 15 September 2009

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