Microwave response of vortices in superconducting thin films of Re and Al

C. Song, T. W. Heitmann, M. P. DeFeo, K. Yu, R. McDermott, M. Neeley, John M. Martinis, and B. L. T. Plourde
Phys. Rev. B 79, 174512 – Published 8 May 2009

Abstract

Vortices in superconductors driven at microwave frequencies exhibit a response related to the interplay between the vortex viscosity, pinning strength, and flux creep effects. At the same time, the trapping of vortices in superconducting microwave resonant circuits contributes excess loss and can result in substantial reductions in the quality factor. Thus, understanding the microwave vortex response in superconducting thin films is important for the design of such circuits, including superconducting qubits and photon detectors, which are typically operated in small, but nonzero, magnetic fields. By cooling in fields on the order of 100μT and below, we have characterized the magnetic field and frequency dependence of the microwave response of a small density of vortices in resonators fabricated from thin films of Re and Al, which are common materials used in superconducting microwave circuits. Above a certain threshold cooling field, which is different for the Re and Al films, vortices become trapped in the resonators. Vortices in the Al resonators contribute greater loss and are influenced more strongly by flux creep effects than in the Re resonators. This different behavior can be described in the framework of a general vortex dynamics model.

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  • Received 18 December 2008

DOI:https://doi.org/10.1103/PhysRevB.79.174512

©2009 American Physical Society

Authors & Affiliations

C. Song1, T. W. Heitmann1, M. P. DeFeo1, K. Yu1, R. McDermott2, M. Neeley3, John M. Martinis3, and B. L. T. Plourde1,*

  • 1Department of Physics, Syracuse University, Syracuse, New York 13244-1130, USA
  • 2Department of Physics, University of Wisconsin–Madison, Madison, Wisconsin 53706, USA
  • 3Department of Physics, University of California, Santa Barbara, California 93106, USA

  • *bplourde@phy.syr.edu

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Vol. 79, Iss. 17 — 1 May 2009

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