Comparison of resonant inelastic x-ray scattering spectra and dielectric loss functions in copper oxides

Jungho Kim, D. S. Ellis, H. Zhang, Young-June Kim, J. P. Hill, F. C. Chou, T. Gog, and D. Casa
Phys. Rev. B 79, 094525 – Published 30 March 2009

Abstract

We report empirical comparisons of CuK-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin-zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi2CuO4, CuGeO3, Sr2Cu3O4Cl2, La2CuO4, and Sr2CuO2Cl2, and analyzed by considering both incident and scattered-photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi2CuO4 and CuGeO3.

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  • Received 27 December 2008

DOI:https://doi.org/10.1103/PhysRevB.79.094525

©2009 American Physical Society

Authors & Affiliations

Jungho Kim, D. S. Ellis, H. Zhang, and Young-June Kim*

  • Department of Physics, University of Toronto, Toronto, Ontario, Canada M5S 1A7

J. P. Hill

  • Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, New York 11973, USA

F. C. Chou

  • Center for Materials Science and Engineering, MIT, Cambridge, Massachusetts 02139, USA

T. Gog and D. Casa

  • XOR, Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

  • *yjkim@physics.utoronto.ca
  • Present address: Center for Condensed Matter Sciences, National Taiwan University, Taipei 10717, Taiwan.

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Issue

Vol. 79, Iss. 9 — 1 March 2009

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