Abstract
We report empirical comparisons of -edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin-zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for , , , , and , and analyzed by considering both incident and scattered-photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in and .
- Received 27 December 2008
DOI:https://doi.org/10.1103/PhysRevB.79.094525
©2009 American Physical Society