Abstract
Raman spectra of thin solid electrolyte films obtained by sputtering a target in nitrogen plasma are measured and compared to ab initio electronic structure calculations for clusters composed of 28 atoms. Agreement between measured and calculated spectra is obtained only when some oxygen atoms are replaced by nitrogen atoms and when these nitrogen atoms form bonds with each other. This suggests that the incorporation of nitrogen during the sputtering process leads to structures in the film, which prevent crystallization of these thin film salt glasses.
- Received 18 June 2007
DOI:https://doi.org/10.1103/PhysRevB.77.094116
©2008 American Physical Society