Spin response in organic spin valves based on La23Sr13MnO3 electrodes

F. J. Wang, C. G. Yang, Z. Valy Vardeny, and X. G. Li
Phys. Rev. B 75, 245324 – Published 21 June 2007

Abstract

We fabricated spin-valve devices made of organic semiconductor thin films sandwiched between ferromagnetic half-metal La23Sr13MnO3 (LSMO) and cobalt electrodes, using three different organic molecules. Subsequently, we studied the spin injection and transport properties by measuring the device magnetoresistance (MR) response at various biasing voltages V and temperatures T. We found that the spin-valve MR response in all devices monotonically decreases with V and is asymmetric with respect to the voltage polarity. We also found a steep MR decrease with T, where it vanishes at T220K, similar to other MR responses in inorganic tunneling junction devices based on LSMO and Co ferromagnetic electrodes. In contrast, the spin-12 photoluminescence detected magnetic resonance of the organic interlayer, which directly depends on the spin-lattice relaxation rate of polarons in the organic semiconductor, was found to be temperature independent. We thus conclude that the steep MR dependence on T is due to the temperature dependence of the interfacial spin polarization of the LSMO electrode, which also drastically decreases up to T220K. We thus conclude that (i) the spin-lattice relaxation time in organic semiconductors should not be the limiting factor in fabricating room temperature organic spin valves, and (ii) in order to achieve room temperature spin-valve operation with substantial MR value, spin-injection electrodes other than LSMO need to be involved, having large and less temperature dependent spin polarization.

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  • Received 12 December 2006

DOI:https://doi.org/10.1103/PhysRevB.75.245324

©2007 American Physical Society

Authors & Affiliations

F. J. Wang, C. G. Yang, and Z. Valy Vardeny*

  • Department of Physics, University of Utah, Salt Lake City, Utah 84112, USA

X. G. Li

  • Hefei National Laboratory for Physics Sciences at Microscale and Department of Materials Science and Engineering, University of Science and Technology of China, Hefei 230026, People’s Republic of China

  • *Author to whom correspondence should be addressed; val@physics.utah.edu

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Issue

Vol. 75, Iss. 24 — 15 June 2007

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