Abstract
We present a structural analysis of the multilayer graphene/ system using surface x-ray reflectivity. We show that graphene films grown on the C-terminated surface have a graphene-substrate bond length that is very short . The measured distance rules out a weak van der Waals interaction to the substrate and instead indicates a strong bond between the first graphene layer and the bulk as predicted by ab initio calculations. The measurements also indicate that multilayer graphene grows in a near turbostratic mode on this surface. This result may explain the lack of a broken graphene symmetry inferred from conduction measurements on this system [C. Berger et al., Science 312, 1191 (2006)].
- Received 22 February 2007
DOI:https://doi.org/10.1103/PhysRevB.75.214109
©2007 American Physical Society