Theory of carrier dynamics and time resolved reflectivity in InxMn1xAsGaSb heterostructures

G. D. Sanders, C. J. Stanton, J. Wang, J. Kono, A. Oiwa, and H. Munekata
Phys. Rev. B 72, 245302 – Published 2 December 2005

Abstract

We present detailed theoretical calculations of two color, time-resolved pump-probe differential reflectivity measurements. The experiments modeled were performed on InxMn1xAsGaSb heterostructures and have shown pronounced oscillations in the differential reflectivity as well as a time-dependent background signal. Previously, we showed that the oscillations resulted from a generation of coherent acoustic phonon wave packets in the epilayer and were not associated with the ferromagnetism. Now we take into account not only the oscillations, but also the background signal which arises from photoexcited carrier effects. The two color pump-probe reflectivity experiments are modeled using a Boltzmann equation formalism. We include photogeneration of hot carriers in the InxMn1xAs quantum well by a pump laser and their subsequent cooling and relaxation by emission of confined LO phonons. Recombination of electron-hole pairs via the Schockley-Read carrier trapping mechanism is included in a simple relaxation time approximation. The time-resolved differential reflectivity in the heterostructure is obtained by solving Maxwell’s equations and by comparing the experiments. Phase space filling, carrier capture and trapping, band-gap renormalization, and induced absorption are all shown to influence the spectra.

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  • Received 6 September 2005

DOI:https://doi.org/10.1103/PhysRevB.72.245302

©2005 American Physical Society

Authors & Affiliations

G. D. Sanders and C. J. Stanton

  • Department of Physics, University of Florida, Box 118440, Gainesville, Florida 32611-8440, USA

J. Wang and J. Kono

  • Department of Electrical and Computer Engineering, Rice Quantum Institute, and Center for Nanoscale Science and Technology, Rice University, Houston, Texas 77005, USA

A. Oiwa and H. Munekata

  • Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Yokohama 226-8503, Japan

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Issue

Vol. 72, Iss. 24 — 15 December 2005

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