In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different substrates

Holger Proehl, Robert Nitsche, Thomas Dienel, Karl Leo, and Torsten Fritz
Phys. Rev. B 71, 165207 – Published 22 April 2005

Abstract

We report an investigation of the excitonic properties of thin crystalline films of the archetypal organic semiconductor PTCDA (3,4,9,10-perylenetetracarboxylic dianhydride) grown on poly- and single crystalline surfaces. A sensitive setup capable of measuring the optical properties of ultrathin organic molecular crystals via differential reflectance spectroscopy (DRS) is presented. This tool allows to carry out measurements in situ, i.e., during the actual film growth, and over a wide spectral range, even on single crystalline surfaces with high symmetry or metallic surfaces, where widely used techniques like reflection anisotropy spectroscopy (RAS) or fluorescence excitation spectroscopy fail. The spectra obtained by DRS resemble mainly the absorption of the films if transparent substrates are used, which simplifies the analysis. In the case of mono- to multilayer films of PTCDA on single crystalline muscovite mica(0001) and Au(111) substrates, the formation of the solid state absorption from monomer to dimer and further to crystal-like absorption spectra can be monitored.

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  • Received 15 September 2004

DOI:https://doi.org/10.1103/PhysRevB.71.165207

©2005 American Physical Society

Authors & Affiliations

Holger Proehl, Robert Nitsche, Thomas Dienel, Karl Leo, and Torsten Fritz*

  • Institut für Angewandte Photophysik, Technische Universität Dresden, D-01062 Dresden, Germany

  • *Electronic address: fritz@iapp.de

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Issue

Vol. 71, Iss. 16 — 15 April 2005

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