2×1 reconstructed Si(111) surface: STM experiments versus ab initio calculations

J. K. Garleff, M. Wenderoth, K. Sauthoff, R. G. Ulbrich, and M. Rohlfing
Phys. Rev. B 70, 245424 – Published 21 December 2004

Abstract

The electronic structure of the Si(111)-2×1 surface has been studied with scanning tunneling spectroscopy (STS). A large experimental local density of states data set of LDOS(x,y,E) with subatomic resolution has been compared with ab initio calculated LDOS distributions. The influence of the tunneling tip DOS has been eliminated by repeated measurements with different tips. The experimentally determined shape of the LDOS(x,y,E) agrees very well with the calculated results based on the π-bonded-chain model for both the surface valence and the conduction band. The good agreement with ab initio calculations of the electronic structure of the Si(111)-2×1 surface shows that STS provides reliable information of the sample LDOS even with subatomic resolution.

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  • Received 8 June 2004

DOI:https://doi.org/10.1103/PhysRevB.70.245424

©2004 American Physical Society

Authors & Affiliations

J. K. Garleff, M. Wenderoth*, K. Sauthoff, and R. G. Ulbrich

  • IV. Physikalisches Institut der Universität Göttingen, Tammannstrasse 1, 37077 Göttingen, Germany

M. Rohlfing

  • School of Engineering and Science, International University Bremen, P.O. Box 750561, 28725 Bremen, Germany

  • *Electronic address: wendero@ph4.physik.uni-goettingen.de

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Issue

Vol. 70, Iss. 24 — 15 December 2004

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