Electronic structures of B2p and C2p levels in boron-doped diamond films studied using soft x-ray absorption and emission spectroscopy

Jin Nakamura, Eiki Kabasawa, Nobuyoshi Yamada, Yasuaki Einaga, Daisuke Saito, Hideo Isshiki, Shigemi Yugo, and Rupert C. C. Perera
Phys. Rev. B 70, 245111 – Published 10 December 2004

Abstract

X-ray absorption (XAS) and emission (XES) spectroscopy near B K and C K edges have been performed on metallic (0.1at.% B, B-diamond) and semiconducting (0.03at.% B and N, BN-diamond) doped diamond films. Both B K XAS and XES spectra show a metallic partial density of states (PDOS) with the Fermi energy of 185.3eV, and there is no apparent boron-concentration dependence in contrast to the different electric property. In C K XAS spectrum of B-diamond, the impurity state ascribed to boron is clearly observed near the Fermi level. The Fermi energy is found to be almost same with the top of the valence band of nondoped diamond: EV=283.9eV. C K XAS of BN-diamond shows both the B-induced shallow level and N-induced deep and broad levels as the in-gap states, in which the shallow level is in good agreement with the activation energy (Ea=0.37eV) estimated from the temperature dependence of the conductivity; namely, the change in C2p PDOS of impurity-induced metallization is directly observed. The electric property of this diamond is ascribed mainly to the electronic structure of C2p near the Fermi level. The observed XES spectra are compared with the discrete variational Xα (DVXα) cluster calculation. The DVXα result supports the strong hybridization between B2p and C2p observed in XAS and XES spectra, and suggests that the small amount of boron (0.1at.%) in diamond occupies the substitutional site rather than interstitial site.

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  • Received 12 June 2004

DOI:https://doi.org/10.1103/PhysRevB.70.245111

©2004 American Physical Society

Authors & Affiliations

Jin Nakamura, Eiki Kabasawa, and Nobuyoshi Yamada

  • Department of Applied Physics & Chemistry, The University of Electro-Communications, Chofu-shi, Tokyo 182-8585, Japan

Yasuaki Einaga

  • Department of Chemistry, Keio University, Hiyoshi, Kanagawa 305-8568, Japan

Daisuke Saito, Hideo Isshiki, and Shigemi Yugo

  • Department of Electro-Engineering, The University of Electro-Communications, Chofu-shi, Tokyo 182-8585, Japan

Rupert C. C. Perera

  • Center for X-ray Optics, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

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Issue

Vol. 70, Iss. 24 — 15 December 2004

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