Abstract
We discuss the electrostatic energy driven type of phase transitions in thin films. They occur under external or built-in electric fields. In the course of transition, the electrostatic energy discharges into structural defects. This may lead to dielectric-film breakdown or Schottky-barrier suppression in semiconductor film junctions. The transitions exhibit the first-order phase transition kinetics, including both the nucleation and spinodal decomposition scenarios.
- Received 6 August 2004
DOI:https://doi.org/10.1103/PhysRevB.70.155332
©2004 American Physical Society