Abstract
Carbon nitride films prepared by magnetron sputtering were studied by multiwavelength Raman spectroscopy. The low/intermediate wavenumber features observed near 400 and are addressed, and the relaxation of the Raman selection rule due to curvature of the graphene planes in the nanoparticles (similar to carbon nanoonions) embedded in thin films is invoked to explain the possible origin of the near band. The shift in the peak center and ratio are correlated with the observed microstructural changes (published before) in order to understand the effect of nitrogenation and deposition temperature on the structure of the films.
- Received 8 March 2004
DOI:https://doi.org/10.1103/PhysRevB.70.035406
©2004 American Physical Society