Immittance matching for multidimensional open-system photonic crystals

Jun Ushida, Masatoshi Tokushima, Masayuki Shirane, Akiko Gomyo, and Hirohito Yamada
Phys. Rev. B 68, 155115 – Published 24 October 2003
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Abstract

An electromagnetic (EM) Bloch wave propagating in a photonic crystal (PC) is characterized by the immittance (impedance and admittance) of the wave. The immittance is used to investigate transmission and reflection at a surface or an interface of the PC. In particular, the general properties of immittance are useful for clarifying the wave propagation characteristics. We give a general proof that the immittance of EM Bloch waves on a plane in infinite one- and two-dimensional (2D) PCs is real when the plane is a reflection plane of the PC and the Bloch wave vector is perpendicular to the plane. We also show that the pure-real feature of immittance on a reflection plane for an infinite three-dimensional PC is good approximation based on the numerical calculations. The analytical proof indicates that the method used for immittance matching is extremely simplified since only the real part of the immittance function is needed for analysis without numerical verification. As an application of the proof, we describe a method based on immittance matching for qualitatively evaluating the reflection at the surface of a semi-infinite 2D PC, at the interface between a semi-infinite slab waveguide (WG) and a semi-infinite 2D PC line-defect WG, and at the interface between a semi-infinite channel WG and a semi-infinite 2D PC slab line-defect WG.

  • Received 20 May 2003

DOI:https://doi.org/10.1103/PhysRevB.68.155115

©2003 American Physical Society

Authors & Affiliations

Jun Ushida1,2,*, Masatoshi Tokushima2, Masayuki Shirane2, Akiko Gomyo2, and Hirohito Yamada1,2

  • 1Optoelectric Industry and Technology Development Association (OITDA), 34 Miyukigaoka, Tsukuba, 305-8501, Japan
  • 2Fundamental Research Laboratories, NEC Corporation, 34 Miyukigaoka, Tsukuba, 305-8501, Japan

  • *Electronic address: ushida@cj.jp.nec.com

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Issue

Vol. 68, Iss. 15 — 15 October 2003

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