Abstract
A quantitative analysis of the surface relaxation at the Yb(111) single-crystal films grown on W(110) has been undertaken applying energy-scan photoelectron diffraction technique using the two shifted components, i.e., surface and bulk of the lanthanide core levels. Additional polar scans were recorded for a fixed photon energy along the crystal high-symmetry directions. The analysis of the data set following a trial and error fitting procedure confirmed a consistent fcc structure for all noncontaminated evaporated Yb films with the bulk lattice parameter corresponding to a value of about 1% contracted respect to the bulk fcc Yb metal. A refinement of the structural analysis indicates an inward surface relaxation of the interlayer spacing for the first two top layers with respect to the bulk lattice parameter.
- Received 28 January 2002
DOI:https://doi.org/10.1103/PhysRevB.66.035411
©2002 American Physical Society