Atomic structure of the GaAs(001)(2×4) surface under As flux

Akihiro Ohtake, Masashi Ozeki, Tetsuji Yasuda, and Takashi Hanada
Phys. Rev. B 65, 165315 – Published 5 April 2002; Erratum Phys. Rev. B 66, 209902 (2002)
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Abstract

The α, β, and γ phases of the GaAs(001)(2×4) surface have been studied using rocking-curve analysis of reflection high-energy electron diffraction (RHEED) and reflectance difference spectroscopy (RDS). We have measured RHEED rocking curves and RD spectra from GaAs(001) under an As flux of 2.5×107Torr, and have identified the temperature ranges where each of the α, β, and γ phases is stable. The 2×4 reconstruction was observed in the range of 480–600 °C. The β phase, which is stable in the range of 510–550 °C, has a β 2(2×4) structure, in good agreement with previous experimental and theoretical results. The γ and α phases are stable below 510 °C and above 550 °C, respectively. While the data from the γ phase are well explained by a mixture of β 2(2×4) and c(4×4) phases, we propose that the α phase has a β 2(2×4) structure, the atomic coordinates of which are slightly different from those of the β phase.

  • Received 14 May 2001

DOI:https://doi.org/10.1103/PhysRevB.65.165315

©2002 American Physical Society

Erratum

Erratum: Atomic structure of the GaAs(001)(2×4) surface under As flux [Phys. Rev. B 65, 165315 (2002)]

Akihiro Ohtake, Masashi Ozeki, Tetsuji Yasuda, and Takashi Hanada
Phys. Rev. B 66, 209902 (2002)

Authors & Affiliations

Akihiro Ohtake*

  • Joint Research Center for Atom Technology (JRCAT), Tsukuba 305-0046, Japan
  • National Institute for Materials Science (NIMS), Tsukuba 305-0047, Japan

Masashi Ozeki

  • Joint Research Center for Atom Technology (JRCAT), Tsukuba 305-0046, Japan
  • Department of Electrical and Electronic Engineering, Faculty of Engineering, Miyazaki University, Miyazaki 889-2192, Japan

Tetsuji Yasuda

  • Joint Research Center for Atom Technology (JRCAT), Tsukuba 305-0046, Japan

Takashi Hanada

  • Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan

  • *Author to whom correspondence should be addressed. Electronic address: OHTAKE.Akihiro@nims.go.jp.

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Issue

Vol. 65, Iss. 16 — 15 April 2002

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