Abstract
Absorption line shapes associated with the stretch mode of bond-center hydrogen at and the twofold degenerate mode of hydrogen near the tetrahedral site at in germanium are measured with infrared-absorption spectroscopy. The line shape measured at 10 K for the case of low hydrogen concentrations gives a lifetime between 15 and 23 ps. Similar in magnitude to the observed for the same defect in silicon [M. Budde et al, Phys. Rev. Lett. 1452 (2000)], this observation indicates that the lifetime of the bond-centered mode is largely insensitive to the phonon frequency distributions of the host material. Pure dephasing dynamics of hydrogen in germanium are studied by measuring the shape of the 1794- and lines as a function of temperature. These measurements are analyzed using a recently formulated exchange model for vibrational dephasing. The temperature dependence of the line shape is attributed to thermal fluctuations in the occupation number of a pseudolocalized mode at
- Received 21 June 2001
DOI:https://doi.org/10.1103/PhysRevB.65.035214
©2002 American Physical Society