Abstract
Raman scattering is shown to provide an effective means to measure spatial correlations in self-assembled quantum dot multilayers. Raman scattering interferences occur when an acoustic phonon interacts with an ensemble of localized electronic states. The interference contrast depends on their spatial correlations. Vertical correlations in self-assembled Ge/Si quantum dot multilayers are deduced from the interference contrast and successfully compared with those measured by transmission electron microscopy.
- Received 9 March 2001
DOI:https://doi.org/10.1103/PhysRevB.64.033306
©2001 American Physical Society