In situ XPS analysis of various iron oxide films grown by NO2-assisted molecular-beam epitaxy

T. Fujii, F. M. F. de Groot, G. A. Sawatzky, F. C. Voogt, T. Hibma, and K. Okada
Phys. Rev. B 59, 3195 – Published 15 January 1999
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Abstract

We report on a systematic analysis of x-ray photoelectron spectroscopy (XPS) core- and valence-level spectra of clean and well-characterized iron oxide films, i.e., αFe2O3, γFe2O3, Fe3δO4, and Fe3O4. All iron oxide films were prepared epitaxially by NO2-assisted molecular-beam epitaxy on single crystalline MgO(100) and αAl2O3(0001) substrates. The phase and stoichiometry of the films were controlled precisely by adjusting the NO2 pressure during growth. The XPS spectrum of each oxide clearly showed satellite structures. These satellite structures were simulated using a cluster-model calculation, which could well reproduce the observed structures by considering the systematic changes in both the Fe 3d to O 2p hybridization and the dd electron-correlation energy. The small difference in the satellite structures between αFe2O3 and γFe2O3 resulted mainly from changes in the Fe-O hybridization parameters, suggesting an increased covalency in γFe2O3 compared to αFe2O3. With increasing reduction in the γFe2O3Fe3O4 system, the satellite structures in XPS became unresolved. This was not only due to the formation of Fe2+ ions, but also to nonhomogeneous changes in the hybridization parameters between octahedral and tetrahedral Fe3+ ions.

  • Received 27 July 1998

DOI:https://doi.org/10.1103/PhysRevB.59.3195

©1999 American Physical Society

Authors & Affiliations

T. Fujii*, F. M. F. de Groot, and G. A. Sawatzky

  • Department of Solid State Physics, Materials Science Centre, University of Groningen, Nijenborgh 4, 9747AG Groningen, The Netherlands

F. C. Voogt and T. Hibma

  • Department of Physical Chemistry, Materials Science Centre, University of Groningen, Nijenborgh 4, 9747AG Groningen, The Netherlands

K. Okada

  • Department of Physics, Faculty of Science, Okayama University, Tsushima-naka 3-1-1, Okayama 700-0082, Japan

  • *Present address: Department of Applied Chemistry, Faculty of Engineering, Okayama University, Tsushima-naka 3-1-1, Okayama 700-0082, Japan.

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Vol. 59, Iss. 4 — 15 January 1999

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