Abstract
Using the “drift-diffusion-Langevin” equation, we have quantitatively analyzed the effects of electron energy relaxation via their interaction with phonons, generally in presence of electron-electron interaction, on shot noise in diffusive conductors. We have found that the noise power (both at low and high observation frequencies drops to half of its “mesoscopic” value only at where is the ratio of the sample length L to the energy relaxation length (the latter may be much larger then the dephasing length). It means in particular that at low temperatures the shot noise may be substantial even when and the conductor is “macroscopic” in any other respect.
- Received 27 March 1998
DOI:https://doi.org/10.1103/PhysRevB.58.15371
©1998 American Physical Society