Abstract
The nature of the interfacial roughness in /Au multilayers was studied using x-ray diffuse scattering. Using an image-plate detector this scattering could be observed to an extended momentum transfer. The roughness exponent and the cutoff length of the interfacial height-height self-correlation function could thereby be determined using a model of conformal roughness, for which the interfaces are smooth within the cutoff length. We also show that while the roughness is not conformal for short length scales, a transition to conformal behavior occurs from ∼25 to 100 Å.
- Received 4 October 1995
DOI:https://doi.org/10.1103/PhysRevB.52.R17052
©1995 American Physical Society