Si K, Si L, and Cr K x-ray valence-band studies of bonding in chromium silicides: Experiment and theory

A. Šimůnek, M. Polčík, and G. Wiech
Phys. Rev. B 52, 11865 – Published 15 October 1995
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Abstract

We present Si K, Si L, and Cr K x-ray emission bands of Cr3Si, CrSi, and CrSi2 together with Si K and Si L emission bands of Cr5Si3. The measured spectra are compared with ab initio pseudopotential calculations of the emission bands of Cr3Si, CrSi, and CrSi2. The Si L spectra were separated into contributions of Si s-like and Si d-like states. Good agreement between theory and experiment is found. The trends in development of spectral features with sample composition can be qualitatively understood by the bonding behavior of Cr and Si atoms.

  • Received 27 February 1995

DOI:https://doi.org/10.1103/PhysRevB.52.11865

©1995 American Physical Society

Authors & Affiliations

A. Šimůnek and M. Polčík

  • Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnická 10, 162 00 Prague 6, Czech Republic

G. Wiech

  • Sektion Physik der Ludwig-Maximilians-Universität München, Geschwister-Scholl-Platz 1, 80539 München, Federal Republic of Germany

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Vol. 52, Iss. 16 — 15 October 1995

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