Magnetic excitations in pure, lightly doped, and weakly metallic La2CuO4

B. Keimer, N. Belk, R. J. Birgeneau, A. Cassanho, C. Y. Chen, M. Greven, M. A. Kastner, A. Aharony, Y. Endoh, R. W. Erwin, and G. Shirane
Phys. Rev. B 46, 14034 – Published 1 December 1992
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Abstract

We report a comprehensive neutron-scattering study of the evolution of the magnetic excitations in La2xSrxCuO4 for 0≤x≤0.04. We first present accurate measurements of the magnetic correlation length and the sublattice magnetization of a carrier-free La2CuO4 crystal and analyze these in the context of recent theoretical predictions. We then systematically investigate the influence of different dopants on the magnetism: Our measurements indicate that static vacancies in the La2Cu1yZnyO4 system affect the magnetic correlations in a similar manner as electrons in Pr2xCexCuO4. The magnetic correlation length is much more rapidly suppressed as a function of x in La2xSrxCuO4, and for x≤0.04 we find that it obeys the empirical relation ξ1(x,T)=ξ1(x,0)+ξ1(0,T), where ξ(0,T) is the measured correlation length of the carrier-free sample. We also report an extensive set of measurements of the dynamical magnetic response function of a crystal of composition La1.96Sr0.04CuO4 for excitation energies 0.75≤ω≤45 meV and temperatures 1.5≤T≤500 K.

The dc conductivity of this crystal exhibits three different regimes: metallic for T≥100 K, weakly localized for 100≥T≥10 K, and strongly localized below ∼1 K. Our neutron measurements show that the generalized susceptibility of this sample follows a surprisingly simple scaling function in the variable ω/T. This observation allows us to relate our data to a variety of normal-state properties of the layered copper oxides, in particular the dc and ac conductivities. Finally, at temperatures below ∼20 K a ‘‘central peak’’ with a characteristic energy scale of less than 0.1 meV becomes prominent. Its relation to the localization of the charge carriers at low temperatures remains speculative.

  • Received 8 April 1992

DOI:https://doi.org/10.1103/PhysRevB.46.14034

©1992 American Physical Society

Authors & Affiliations

B. Keimer, N. Belk, R. J. Birgeneau, A. Cassanho, C. Y. Chen, M. Greven, and M. A. Kastner

  • Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

A. Aharony

  • School of Physics and Astronomy, Tel Aviv University, Tel Aviv 69978, Israel

Y. Endoh

  • Department of Physics, Tohoku University, Sendai 980, Japan

R. W. Erwin

  • National Institute of Standards and Technology, Gaithersburg, Maryland 20899

G. Shirane

  • Brookhaven National Laboratory, Upton, New York 11973

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Issue

Vol. 46, Iss. 21 — 1 December 1992

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