High-pressure x-ray diffraction studies on rhenium up to 216 GPa (2.16 Mbar)

Yogesh K. Vohra, Steven J. Duclos, and Arthur L. Ruoff
Phys. Rev. B 36, 9790 – Published 15 December 1987
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Abstract

Energy-dispersive x-ray diffraction techniques using a synchrotron source were used to study rhenium. The hcp structure is stable up to the highest pressure used 216 GPa (volume fraction V/V0=0.734), and the axial ratio (c/a) is independent of pressure within experimental errors. The present study represents the first x-ray measurement above 2 Mbar, and diffraction patterns with 12 peaks were used to confirm the structure. This is also the first case in which x rays were used to obtain a pressure profile across the diamond face. The suitability of rhenium as a gasket material in ultrahigh-pressure experiments is also discussed.

  • Received 17 June 1987

DOI:https://doi.org/10.1103/PhysRevB.36.9790

©1987 American Physical Society

Authors & Affiliations

Yogesh K. Vohra, Steven J. Duclos, and Arthur L. Ruoff

  • Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853

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Issue

Vol. 36, Iss. 18 — 15 December 1987

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