Superconducting Tc enhancement in weakly disordered Ge-covered tin films

R. S. Parashar and Vipin Srivastava
Phys. Rev. B 32, 6048 – Published 1 November 1985
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Abstract

We report on the variation of the superconducting transition temperature with the electrical resistance ratio in weakly disordered Ge-covered tin films deposited at room temperature. The normal-state sheet resistance RN varied between 0.2<RN<4.2 Ω/□. The transition temperature shows a maximum when the resistance ratio ∼7.5. Results are discussed in the light of the Anderson localization.

  • Received 22 March 1985

DOI:https://doi.org/10.1103/PhysRevB.32.6048

©1985 American Physical Society

Authors & Affiliations

R. S. Parashar and Vipin Srivastava

  • School of Physics, University of Hyderabad, Hyderabad 500134, Andhra Pradesh, India

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Issue

Vol. 32, Iss. 9 — 1 November 1985

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