Abstract
We report on the variation of the superconducting transition temperature with the electrical resistance ratio in weakly disordered Ge-covered tin films deposited at room temperature. The normal-state sheet resistance varied between 0.2<<4.2 Ω/□. The transition temperature shows a maximum when the resistance ratio ∼7.5. Results are discussed in the light of the Anderson localization.
- Received 22 March 1985
DOI:https://doi.org/10.1103/PhysRevB.32.6048
©1985 American Physical Society