Defects in irradiated silicon: EPR of the tin-vacancy pair

G. D. Watkins
Phys. Rev. B 12, 4383 – Published 15 November 1975
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Abstract

An EPR spectrum, labeled Si-G29, is identified as a lattice vacancy trapped by substitutional tin. The resulting tin-vacancy pair is observed in its neutral ground state with S=1. Studies versus wavelength of illumination indicate that it has a donor level at Ev+0.35 eV. Analysis of the EPR spectrum leads to a model in which the tin atom resides in a position halfway between two normal silicon atom sites (D3d). It is stable to ∼500 K.

  • Received 7 July 1975

DOI:https://doi.org/10.1103/PhysRevB.12.4383

©1975 American Physical Society

Authors & Affiliations

G. D. Watkins*

  • General Electric Corporate Research and Development, Schenectady, New York 12301

  • *Present address: Dept. of Physics, Lehigh University, Bethlehem, Pa. 18015

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Vol. 12, Iss. 10 — 15 November 1975

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