Abstract
We report the quantum calibration of a magnetic force microscope (MFM) by measuring the two-dimensional magnetic stray-field distribution of the MFM tip using a single nitrogen vacancy (NV) center in diamond. From the measured stray-field distribution and the mechanical properties of the cantilever a calibration function is derived allowing to convert MFM images to quantum calibrated stray-field maps. This approach overcomes limitations of prior MFM calibration schemes and allows quantum calibrated nanoscale stray-field measurements in a field range inaccessible to scanning NV magnetometry. Quantum calibrated measurements of a stray-field reference sample allow its use as a transfer standard, opening the road towards fast and easily accessible quantum traceable calibrations of virtually any MFM.
- Received 25 March 2021
- Revised 3 December 2021
- Accepted 3 December 2021
DOI:https://doi.org/10.1103/PhysRevB.104.214427
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