• Letter

Robust wavefront dislocations of Friedel oscillations in gapped graphene

Shu-Hui Zhang, Jin Yang, Ding-Fu Shao, Zhenhua Wu, and Wen Yang
Phys. Rev. B 103, L161407 – Published 21 April 2021
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Abstract

Friedel oscillation is a well-known wave phenomenon which represents the oscillatory response of electron waves to imperfection. By utilizing the pseudospin-momentum locking in gapless graphene, two recent experiments demonstrate the measurement of the topological Berry phase by corresponding to the unique number of wavefront dislocations in Friedel oscillations. Here, we study the Friedel oscillations in gapped graphene, in which the pseudospin-momentum locking is broken. Unusually, the wavefront dislocations do occur like that in gapless graphene, which requires immediate verification in the current experimental condition. The number of wavefront dislocations is ascribed to the invariant pseudospin winding number in gapped and gapless graphene. This study deepens the understanding of the correspondence between topological quantity and wavefront dislocations in Friedel oscillations and implies the possibility to observe the wavefront dislocations of Friedel oscillations in intrinsic gapped two-dimensional materials, e.g., transition metal dichalcogenides.

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  • Received 3 January 2021
  • Revised 11 April 2021
  • Accepted 12 April 2021

DOI:https://doi.org/10.1103/PhysRevB.103.L161407

©2021 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Shu-Hui Zhang1,*,†, Jin Yang2,*, Ding-Fu Shao3, Zhenhua Wu4, and Wen Yang2,‡

  • 1College of Mathematics and Physics, Beijing University of Chemical Technology, Beijing 100029, China
  • 2Beijing Computational Science Research Center, Beijing 100193, China
  • 3Department of Physics and Astronomy and Nebraska Center for Materials and Nanoscience, University of Nebraska–Lincoln, Lincoln, Nebraska 68588-0299, USA
  • 4Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China

  • *S.-H.Z. and J.Y. contributed equally to this work.
  • shuhuizhang@mail.buct.edu.cn
  • wenyang@csrc.ac.cn

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Issue

Vol. 103, Iss. 16 — 15 April 2021

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