Abstract
We present out-of-plane dielectric and magnetodielectric measurements of single-crystalline with various degrees of stacking faults. A frequency-dependent, but field-independent, dielectric anomaly appears at K once both magnetic transitions at K and K set in. The observed dielectric anomaly is attributed to the emergence of possible local electric polarizations whose inversion symmetry is broken by inhomogeneously distributed stacking faults. A field-induced intermediate phase is only observed when a magnetic field is applied perpendicular to the Ru-Ru bonds for samples with minimal stacking faults. Less pronounced in-plane anisotropy is found in samples with a sizable contribution from stacking imperfections. Our findings suggest that dielectric measurement is a sensitive probe in detecting the structural and magnetic properties, which may be a promising tool, especially in studying thin-film devices. Moreover, the stacking details of layers strongly affect the ground state both in the magnetic and electric channels. Such a fragile ground state against stacking faults needs to be overcome for realistic applications utilizing the magnetic and/or electric properties of Kitaev-based physics in .
- Received 15 January 2021
- Revised 21 April 2021
- Accepted 27 April 2021
DOI:https://doi.org/10.1103/PhysRevB.103.174413
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