Melting of Néel skyrmion lattice

Pavel Baláž, Marek Paściak, and Jiří Hlinka
Phys. Rev. B 103, 174411 – Published 10 May 2021

Abstract

Melting of a particle lattice in two dimensional systems substantially differs from the one in three dimensions. The most prominent theory of the lattice melting in 2D, formulated by Kosterlitz, Thouless, Halperin, Nelson, and Young (KTHNY), describes the solid-liquid phase transition as a two-step process, where the solid phase turns into the liquid via the hexatic phase. The microscopic nature of this process lies in the excitation and unbinding of topological defects in the 2D lattice. The KTHNY melting scenario has been observed in number of 2D physical systems. Here, we theoretically analyze the melting process of a Néel skyrmion lattice by means of numerical simulations using a model of lacunar spinel GaV4S8 hosting hexagonal skyrmion lattice at low temperatures. We show that topological defects are excited in such skyrmion lattice causing its melting via the hexatic phase in agreement with the KTHNY theory.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
2 More
  • Received 8 February 2021
  • Revised 29 April 2021
  • Accepted 29 April 2021

DOI:https://doi.org/10.1103/PhysRevB.103.174411

©2021 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Pavel Baláž*, Marek Paściak, and Jiří Hlinka

  • Department of Dielectrics, FZU–Institute of Physics of the Czech Academy of Sciences, Na Slovance 1999/2, 182 21 Prague 8

  • *balaz@fzu.cz

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 103, Iss. 17 — 1 May 2021

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×