Band structure of a HgTe-based three-dimensional topological insulator

J. Gospodarič, V. Dziom, A. Shuvaev, A. A. Dobretsova, N. N. Mikhailov, Z. D. Kvon, E. G. Novik, and A. Pimenov
Phys. Rev. B 102, 115113 – Published 8 September 2020
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Abstract

From the analysis of the cyclotron resonance, we experimentally obtain the band structure of the three-dimensional topological insulator based on a HgTe thin film. Top gating was used to shift the Fermi level in the film, allowing us to detect separate resonance modes corresponding to the surface states at two opposite film interfaces, the bulk conduction band, and the valence band. The experimental band structure agrees reasonably well with the predictions of the k·p model. Due to the strong hybridization of the surface and bulk bands, the dispersion of the surface states is close to parabolic in the broad range of the electron energies.

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  • Received 6 December 2019
  • Revised 5 August 2020
  • Accepted 14 August 2020

DOI:https://doi.org/10.1103/PhysRevB.102.115113

©2020 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

J. Gospodarič1,*, V. Dziom1, A. Shuvaev1, A. A. Dobretsova2, N. N. Mikhailov2, Z. D. Kvon2, E. G. Novik3,4, and A. Pimenov1

  • 1Institute of Solid State Physics, Vienna University of Technology, 1040 Vienna, Austria
  • 2Rzhanov Institute of Semiconductor Physics and Novosibirsk State University, Novosibirsk 630090, Russia
  • 3Dresden High Magnetic Field Laboratory (HLD-EMFL), Helmholtz-Zentrum Dresden-Rossendorf, 01328 Dresden, Germany
  • 4Institute of Theoretical Physics, Technische Universität Dresden, 01062 Dresden, Germany

  • *jan.gospodaric@tuwien.ac.at

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Issue

Vol. 102, Iss. 11 — 15 September 2020

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