Spectroscopic Study of N-V Sensors in Diamond-Based High-Pressure Devices

Kin On Ho, Man Yin Leung, Wenyan Wang, Jianyu Xie, King Yau Yip, Jiahao Wu, Swee K. Goh, Andrej Denisenko, Jörg Wrachtrup, and Sen Yang
Phys. Rev. Applied 19, 044091 – Published 28 April 2023
PDFHTMLExport Citation

Abstract

High-pressure experiments are crucial in modern interdisciplinary research fields such as engineering quantum materials, yet local probing techniques remain restricted due to the tight confinement of the pressure chamber in certain pressure devices. Recently, the negatively charged nitrogen-vacancy (N-V) center has emerged as a robust and versatile quantum sensor in pressurized environments. There are two popular ways to implement N-V sensing in a diamond anvil cell (DAC), which is a conventional workhorse in the high-pressure community: create implanted N-V centers (IN-Vs) at the diamond anvil tip or immerse N-V-enriched nanodiamonds (NDs) in the pressure medium. Nonetheless, there are limited studies on comparing the local stress environments experienced by these sensor types as well as their performances as pressure gauges. In this work, by probing the N-V energy levels with the optically detected magnetic resonance (ODMR) method, we experimentally reveal a dramatic difference in the partially reconstructed stress tensors of IN-Vs and NDs incorporated in the same DAC. Our measurement results agree with computational simulations, concluding that IN-Vs perceive a more nonhydrostatic environment dominated by a uniaxial stress along the DAC axis. This provides insights on the suitable choice of N-V sensors for specific purposes and the stress distribution in a DAC. We further propose some possible methods, such as using NDs and diamond nanopillars, to extend the maximum working pressure of quantum sensing based on ODMR spectroscopy, since the maximum working pressure could be restricted by nonhydrostaticity of the pressure environment. Moreover, we explore more sensing applications of the N-V center by studying how pressure modifies different aspects of the N-V system. We perform a PL study using both IN-Vs and NDs to determine the pressure dependence of the zero-phonon line, which helps developing an all-optical pressure sensing protocol with the N-V center. We also characterize the spin-lattice relaxation (T1) time of IN-Vs under pressure to lay a foundation for robust pulsed measurements with N-V centers in pressurized environments.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 15 January 2023
  • Revised 20 March 2023
  • Accepted 23 March 2023

DOI:https://doi.org/10.1103/PhysRevApplied.19.044091

© 2023 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied PhysicsQuantum Information, Science & TechnologyAtomic, Molecular & Optical

Authors & Affiliations

Kin On Ho1,†, Man Yin Leung2,†, Wenyan Wang1,†, Jianyu Xie1, King Yau Yip1, Jiahao Wu2, Swee K. Goh1,3, Andrej Denisenko4,5, Jörg Wrachtrup4,5, and Sen Yang2,1,*

  • 1Department of Physics, The Chinese University of Hong Kong, Shatin, New Territories, Hong Kong, China
  • 2Department of Physics, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China
  • 3Shenzhen Research Institute, The Chinese University of Hong Kong, Shatin, New Territories, Hong Kong, China
  • 43. Physikalisches Institut, Integrated Quantum Science and Technology (IQST), University of Stuttgart, Pfaffenwaldring 57, Stuttgart 70569, Germany
  • 5Max Planck Institute for Solid State Research, Stuttgart, Germany

  • *phsyang@ust.hk
  • These authors contributed equally to this work.

Article Text (Subscription Required)

Click to Expand

Supplemental Material (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 19, Iss. 4 — April 2023

Subject Areas
Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Applied

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×