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Fast Bayesian Tomography of a Two-Qubit Gate Set in Silicon

T.J. Evans, W. Huang, J. Yoneda, R. Harper, T. Tanttu, K.W. Chan, F.E. Hudson, K.M. Itoh, A. Saraiva, C.H. Yang, A.S. Dzurak, and S.D. Bartlett
Phys. Rev. Applied 17, 024068 – Published 25 February 2022

Abstract

Benchmarking and characterizing quantum states and logic gates is essential in the development of devices for quantum computing. We introduce a Bayesian approach to self-consistent process tomography, called fast Bayesian tomography (FBT), and experimentally demonstrate its performance in characterizing a two-qubit gate set on a silicon-based spin qubit device. FBT is built on an adaptive self-consistent linearization that is robust to model approximation errors. Our method offers several advantages over other self-consistent tomographic methods. Most notably, FBT can leverage prior information from randomized benchmarking (or other characterization measurements), and can be performed in real time, providing continuously updated estimates of full process matrices while data are acquired.

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  • Received 8 September 2021
  • Revised 29 September 2021
  • Accepted 2 February 2022

DOI:https://doi.org/10.1103/PhysRevApplied.17.024068

© 2022 American Physical Society

Physics Subject Headings (PhySH)

Quantum Information, Science & Technology

Authors & Affiliations

T.J. Evans1, W. Huang2, J. Yoneda2, R. Harper1, T. Tanttu2, K.W. Chan2, F.E. Hudson2, K.M. Itoh3, A. Saraiva2, C.H. Yang2, A.S. Dzurak2, and S.D. Bartlett1,*

  • 1Centre for Engineered Quantum Systems, School of Physics, The University of Sydney, Sydney 2006, Australia
  • 2School of Electrical Engineering and Telecommunications, The University of New South Wales, Sydney, NSW 1466, Australia
  • 3School of Fundamental Science and Technology, Keio University, Yokohama 223-8521, Japan

  • *stephen.bartlett@sydney.edu.au

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Vol. 17, Iss. 2 — February 2022

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