Abstract
We report the development of a scanning force microscope based on an ultrasensitive silicon nitride membrane optomechanical transducer. Our development is made possible by inverting the standard microscope geometry—in our instrument, the substrate is vibrating and the scanning tip is at rest. We present topography images of samples placed on the membrane surface. Our measurements demonstrate that the membrane retains an excellent force sensitivity when loaded with samples and in the presence of a scanning tip. We discuss the prospects and limitations of our instrument as a quantum-limited force sensor and imaging tool.
- Received 16 October 2020
- Accepted 23 December 2020
DOI:https://doi.org/10.1103/PhysRevApplied.15.L021001
© 2021 American Physical Society
Physics Subject Headings (PhySH)
Focus
Force Scanning on a Shaky Membrane
Published 5 February 2021
A microscope technique that visualizes small objects on a vibrating membrane could deliver atomically resolved MRI scans.
See more in Physics